CR7300 Analysis

Particle Pattern Map

Particle distribution map on the wafer.

Wafer Map Chart Placeholder (Particles: 4)

SEM Image Information

Detailed SEM images for identified particles.

SEM for P001ID: P001, X: 123.45, Y: 678.90
SEM for P002ID: P002, X: 234.56, Y: 789.01
SEM for P003ID: P003, X: 345.67, Y: 890.12
SEM for P004ID: P004, X: 456.78, Y: 901.23
Composition Statistics

Statistical breakdown of particle compositions.

Composition Counts:

SiN: 2

SiO2: 1

AlOx: 1